The SPY Grain Grader from Maztech MicroVision Ltd., Ottawa, Ontario, Canada, is the first benchtop equipment of its kind to use digital image analysis for objective determinations of grade and non-grade factors in grains and seeds. The instrument can detect fusarium damaged kernels and areas of discoloration caused by other fungal diseases. On a per kernel basis, the SPY provides a rapid screening tool for verifying the presence or absence of fusarium damage, quantifies the amount of surface discoloration on kernels, and measures kernel size and shape characteristics. Using proprietary digital technology, the SPY delivers objective rapid grain analysis 24 hours a day. Maztech also will verify customers' samples on the above determinations or test samples for new applications.